Yra yra kelios priežastys kodėl danga storis matuokliai gali būti netikslus
Dėl danga storis matuokliai, yra daugiausia the following priežastys kad priežastis netikslūs matavimai.
(1) Trukdžiai nuo stipraus magnetinių laukų. Mes kartą laidūs a paprastas eksperimentas. Kada the instrumentas veikia arti an elektromagnetinis laukas of 10,000%V, the measurement will be severely interfered. If you are labai arti to the electromagnetic field, a crash may happen.
(2) Žmogiškieji veiksniai. Ši situacija dažnai atsitinka į naujus vartotojus. The reason why the coating storis gabaritas can measure to the micron level is that it can take small changes in magnetic flux and convert it into a digital signal. During the measurement process, if the user is not familiar with the instrument, the probe may deviate from the body being measured, causing changes in the magnetic flux and causing erroneous measurements. Todėl, it is rekomenduojama kad vartotojai pirmas master the measurement metodas kai naudojant šis instrumentas for the first time. The placement of the probe has a great influence on the measurement. The prob should bed bed med perpendicular to the surface of the sample during measurement. And the probe should not be placed for too long to avoid interference from the magnetic field of the matrix herself.
(3) No appropriate matrix was selected during system kalibravimas. The minimum flat surface of the substrate is 7mm and the minimum storis is 0.2mm. Matavimai žemiau šie kritinės sąlygos are nepatikimi.
(4) The influence of attached substances. This instrument is sensitive to attached substances that prevent the probe from making close contact with the cover surface. Todėl, attached materials must be removed to ensure direct contact between the probbe and the cover surface. When performing system calibration, the surface of the selected substrate must be bare and smooth.
(5) The instrument fails. At this time, you can communicate with technicians or return to the factory for repair.
Per the measurement process, why do there sometimes appear significant nuokrypiai in the measurement data?
Per the measurement process, due to incorrect placement of the probbe or the influence of external interference factors, the measurement data may be significantly larger. At this time, you can hold down the CAL key to clear the data to avoid entering the data statistics.
